A Bayesian Approach to IEC 61511 Prior Use

I am pleased to announce that I will be speaking at the 2017 Triconex User Group on May 24-25 in Lake Forest, CA.

This presentation is a follow up to my 2016 ISA workshop that provided a broad overview of confidence intervals and highlighted the advantages of a Bayesian approach.  This focused presentation will concentrate on gathering and analyzing failure rate data for individual SIS field devices for the purpose of prior use justification.  We will outline the structure and highlight the advantages of a hierarchical Bayesian approach.

After the presentation, you will see that the equation below is nothing to be afraid of.  In fact, it is the key to saving time and money, and “closing the loop” on SIS performance.

The Triconex User Group conference is always a great event, so please join me.

Learn more about Bayes theorem and Bayesian reliability from the books in our store.  Thanks for supporting FunctionalSafetyEngineer.com!

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